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Materials Science
HRTEM and HRSTEM: Atomic Resolution TEM and STEM Imaging
High resolution TEM imaging for the characterization of nanoscale and nanomaterial samples.
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HRTEM
Transmission and scanning transmission electron microscopes (S/TEM) are invaluable tools for the characterization of nanostructures, providing a range of different imaging modes, as well as access to information on elemental composition and electronic structure with high sensitivity. As materials research progressively begins to focus more and more on optimizing material function and behavior at the nanoscale, accurate information at this resolution becomes increasingly essential. High-resolution TEM (HRTEM) and STEM (HRSTEM) deliver the most detailed structural information possible in order to fundamentally characterize samples down to their atomic organization. This is invaluable to nanomaterials research as minor structural inconsistencies and variations can result in substantial changes to the properties of the material. For example, the crystal structure and atomic spacing of the atoms in platinum nanoparticles can have a drastic impact on their catalytic behavior in hydrogen fuel cells.
HRTEM microscopy
Thermo Fisher Scientific offers hardware and software innovations for HRTEM and HRSTEM analysis of a broad range of samples, including beam-sensitive materials. In particular, image quality is often reduced by the influence of drift, vibrations, or other instabilities during acquisition. Drift corrected frame integration (DCFI) is an acquisition method within the Thermo Scientific Velox Software that overcomes this problem, producing images with high contrast and a high signal-to-noise ratio. The addition of Integrated Differential Phase Contrast (iDPC) Software enables the collection of easily interpretable high-resolution images with more reliable, simultaneous imaging of light and heavy elements, even at low-dose conditions.
High-resolution transmission electron microscopes from Thermo Fisher Scientific
The Spectra S/TEM instruments take high-resolution imaging one step further with additional aberration correction via the S-CORR probe aberration corrector, making sub-Angstrom (<0.8 Å) S/TEM imaging regularly attainable. Finally, new Talos and Spectra S/TEM instruments feature the Panther STEM detection system, which includes optimized mechanical alignment and detector geometry for better multi-signal acquisition and mechanical alignment accuracy. It has a higher throughput and easier operation, with linear response of gain/offset and more flexibility in signal processing. Visualize more details with up to 16 segments and a new amplifier design with ultrahigh electron sensitivity for low-dose STEM.
With the combination of high-quality automated S/TEM instrumentation and leading software solutions, HRTEM and HRSTEM imaging are more accessible than ever, giving you the ability to gather unparalleled atomic-resolution information on your most challenging materials.
Gallium nitride [212] imaged with HAADF (DCFI) STEM at 300 kV, showing 40.5 pm Ga-Ga dumbbell splitting and 39 pm resolution in the fast Fourier transform on a wide gap (S-TWIN) pole piece.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Investigación sobre materiales fundamentales
Se investigan nuevos materiales a escalas cada vez más pequeñas para lograr el máximo control de sus propiedades físicas y químicas. La microscopía electrónica proporciona a los investigadores información clave sobre una amplia variedad de características materiales a escala nanométrica.
Investigación de baterías
El desarrollo de baterías se realiza mediante análisis multiescala con microCT, SEM y TEM, espectroscopía Raman, XPS y visualización y análisis 3D digital. Aprenda cómo este enfoque proporciona la información estructural y química necesaria para crear mejores baterías.
Nanopartículas
Los materiales tienen propiedades sustancialmente diferentes en la nanoescala y en la macroescala. Para estudiarlos, la instrumentación S/TEM se puede combinar con la espectroscopia de rayos X por dispersión de energía para obtener datos de resolución nanométrica, o incluso subnanométrica.
Investigación sobre metales
La producción eficaz de metales requiere un control preciso de las inclusiones y precipitados. Nuestras herramientas automatizadas pueden realizar varias tareas cruciales para el análisis de metales, incluyendo el recuento de nanopartículas, el análisis químico EDS y la preparación de muestras de TEM.
Fibras y filtros
El diámetro, la morfología y la densidad de las fibras sintéticas son parámetros clave que determinan la vida útil y la funcionalidad de un filtro. La microscopía electrónica de barrido (SEM) es la técnica ideal para investigar rápida y fácilmente estas características.
Investigación sobre polímeros
La microestructura polimérica determina las características y el rendimiento del material a granel. La microscopía electrónica permite un análisis exhaustivo en microescala de la morfología y composición de los polímeros para aplicaciones de control de calidad e I+D.
Investigación geológica
Las ciencias geológicas están basadas en la observación uniforme y precisa de múltiples escalas de características dentro de las muestras de roca. SEM-EDS, combinado con software de automatización, permite el análisis directo a gran escala de la composición de la textura y los minerales para la investigación de la petrología y la mineralogía.
Investigación sobre catálisis
Los catalizadores son cruciales para la mayoría de los procesos industriales modernos. Su eficacia depende de la composición microscópica y la morfología de las partículas catalíticas; EM con EDS es ideal para estudiar estas propiedades.
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