Few disciplines rely as heavily on consistent, multi-scale observation and interpretation of features as the earth sciences. Everything from deep earth flow processes to more efficient methods of resource extraction are dependent on accurate sample characterization.

Thermo Fisher Scientific has built a family of imaging platforms and software solutions to facilitate data collection, visualization and analysis during complicated multi-modal, multi-scale characterization routines.

 

Petrology and mineralogy

Accurate textural analysis and the associated distribution of minerals within the rock texture are key to accurately describing the physical and chemical aspects of a rock system. Automated determination of mineralogy, based on scanning electron microscopy coupled with energy-dispersive X-ray spectroscopy (SEM-EDS), has established itself as a popular method for acquiring high-resolution images and chemical maps in the mining and mineral processing industries. Thermo Fisher Scientific has a 30-year history of delivering market-leading SEM-EDS technology. Here are just a few of the advantages afforded by our petrology and mineralogy solutions;

  • Expand the number of samples that can be processed with routine petrologic and mineralogic analysis
  • Build a strong statistical repository of mineral content based on automated analysis
  • Automatically obtain accurate mineralogical identification
  • Create a digital inventory of your thin sections and associated mineral assemblages
  • Combine EDS elemental analysis, mineralogy and high-resolution imagery for advanced sample interpretation
  • Analyze more samples for more robust statistics
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Multi-scale analysis

While context is vital for textural analysis, it is especially important for geological or structural interpretation. Electron imaging captures a large number of modalities in a single acquisition, allowing for direct interpretation of composition and texture. However, simply observing a single frame, or even a series of images, out of context reduces the power of this analysis.

We provide a suite of automation software developed with the express purpose of preserving context. Thermo Scientific Maps Software is the cross-platform automation engine for our full line of electron microscopy imaging platforms. Maps Software takes the pain out of acquiring larger image mosaics within an easy to use and intuitive software environment.

  • Preserve context with large, automatically acquired, high-resolution datasets
  • Utilize system time efficiently
  • Share observations with context for more collaborative data interpretation

Applications

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

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3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

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EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

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3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

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Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

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Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

Products

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Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200X TEM

  • High resolution/throughput in STEM imaging and chemical analysis
  • Add application-specific in situ sample holders for dynamic experiments
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Helios 5 DualBeam

  • Fully automated, high-quality, ultra-thin TEM sample preparation
  • High throughput, high resolution subsurface and 3D characterization
  • Rapid nanoprototyping capabilities

Helios 5 PFIB DualBeam

  • Gallium-free STEM and TEM sample preparation
  • Multi-modal subsurface and 3D information
  • Next-generation 2.5 μA xenon plasma FIB column

Scios 2 DualBeam

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities

HeliScan microCT

  • Advanced helical scanning and iterative reconstruction technology
  • High resolution x-ray source (below 400 nm)
  • Process, analyze, and visualize samples

Maps Software

  • Acquire high resolution images over large areas
  • Easily find regions of interest
  • Automate image acquisition process
  • Correlate data from different sources

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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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