Multi scale microscopy workflow plot showing microCT, PFIB, and TEM
Plot of volume and resolution that can be analyzed by various instruments
in the multi-scale analysis workflow.

As materials continue to advance, it is becoming increasingly important to not only examine them at ever-higher resolutions but to obtain these observations within the relevant macroscopic context. This necessitates correlating different imaging modes to the same coordinates for truly contextual insight. Measurements must also be obtained quickly enough for practical application in real-world process control and failure analysis environments. Thermo Fisher Scientific offers a complete workflow for the observation of materials, combining correlated imaging at various scales with additional information such as chemical composition.

Multi-scale analysis begins with micro-scale observation with non-destructive spectroscopic techniques. X-ray microtomography (microCT) produces a complete, 3D rendering of the sample through serial X-ray scans. These scans, or 2D tomograms, are digitally combined to form the 3D structure. With Thermo Scientific Heliscan MicroCT, the series of circular scans is replaced by a single, continuous helical scan. This allows for faster scanning at a lower dose, increasing the accuracy and amount of information obtained. MicroCT observations can provide resolution as low as 400 nm, making it an ideal tool for non-destructive surveying of the sample prior to higher resolution characterization.

Once a region of interest is identified, DualBeam (focused ion beam and scanning electron microscopy, FIB-SEM) instrumentation is used for closer surface analysis and sample extraction. (Note that the focused ion beam can consist of a liquid metal ion source (gallium) or a plasma FIB.) The SEM enables nanoscale surface analysis while the FIB/PFIB is used for serial sectioning, or to extract a thin sample lamella for further observation with transmission electron microscopy (TEM). The addition of a femtosecond laser to the PFIB-SEM allows for even more rapid sample preparation, cross-sectioning or serial sectioning. Subsequent TEM analysis provides atomic-scale materials characterization for complete insight into a sample’s elemental and structural composition.

True multi-scale microscopy generates high quality and reliable imaging across all instruments while also accurately aligning them into a complete representation of the sample. With Thermo Scientific automation and data analysis software, the entire multi-scale workflow becomes a guided and routine procedure that can be readily integrated into your process or quality control environment.

Multi scale microscopy workflow plot showing software and hardware
The multi-scale analysis workflow offered by Thermo Fisher Scientific integrating software and hardware.
*Maps is not directly integrated with mCT, it can load processed CT data.
**AutoScript is not available yet on HeliScan and TEM microscopes.

HeliScan MicroCT analysis used in the correlative study of defects in an oil filter casing made of a glass-fiber-reinforced composite.

Characterizing material failure of an additively manufactured Inconel 718 part with multi-scale analysis. Performed in collaboration with the University of Manchester.

HeliScan MicroCT analysis used in the correlative study of defects in an oil filter casing made of a glass-fiber-reinforced composite.

Characterizing material failure of an additively manufactured Inconel 718 part with multi-scale analysis. Performed in collaboration with the University of Manchester.

Applications

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Battery Research

Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.

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Polymers Research

Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.

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Metals Research

Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

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Oil and Gas

As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications.

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Geological Research

Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.

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Fibers and Filters

The diameter, morphology and density of synthetic fibers are key parameters that determine the lifetime and functionality of a filter. Scanning electron microscopy (SEM) is the ideal technique for quickly and easily investigating these features.

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Automotive Materials Testing

Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials.

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Products

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Helios 5 Laser PFIB System

  • Fast, millimeter-scale cross sections
  • Statistically relevant deep subsurface and 3D data analysis
  • Shares all capabilities of the Helios 5 PFIB platform

Helios Hydra DualBeam

  • 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials
  • Ga-free TEM sample preparation
  • Extreme high resolution SEM imaging

Helios 5 PFIB DualBeam

  • Gallium-free STEM and TEM sample preparation
  • Multi-modal subsurface and 3D information
  • Next-generation 2.5 μA xenon plasma FIB column

Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Talos F200X TEM

  • High resolution/throughput in STEM imaging and chemical analysis
  • Add in situ sample holders for dynamic experiments
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Scios 2 DualBeam

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities

HeliScan microCT

  • Advanced helical scanning and iterative reconstruction technology
  • High resolution x-ray source (below 400 nm)
  • Process, analyze, and visualize samples

Maps Software

  • Acquire high resolution images over large areas
  • Easily find regions of interest
  • Automate image acquisition process
  • Correlate data from different sources

AutoTEM 5

  • Fully automated in situ S/TEM sample preparation
  • Support of top-down, planar and inverted geometry
  • Highly configurable workflow
  • Easy to use, intuitive user interface

Auto Slice and View 4.0 Software

  • Automated serial sectioning for DualBeam
  • Multi-modal data acquisition (SEM, EDS, EBSD)
  • On-the-fly editing capabilities
  • Edge based cut placement

Avizo Software

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms
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