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Materials Science
HRTEM and HRSTEM: Atomic Resolution TEM and STEM Imaging
High resolution TEM imaging for the characterization of nanoscale and nanomaterial samples.
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HRTEM
Transmission and scanning transmission electron microscopes (S/TEM) are invaluable tools for the characterization of nanostructures, providing a range of different imaging modes, as well as access to information on elemental composition and electronic structure with high sensitivity. As materials research progressively begins to focus more and more on optimizing material function and behavior at the nanoscale, accurate information at this resolution becomes increasingly essential. High-resolution TEM (HRTEM) and STEM (HRSTEM) deliver the most detailed structural information possible in order to fundamentally characterize samples down to their atomic organization. This is invaluable to nanomaterials research as minor structural inconsistencies and variations can result in substantial changes to the properties of the material. For example, the crystal structure and atomic spacing of the atoms in platinum nanoparticles can have a drastic impact on their catalytic behavior in hydrogen fuel cells.
HRTEM microscopy
Thermo Fisher Scientific offers hardware and software innovations for HRTEM and HRSTEM analysis of a broad range of samples, including beam-sensitive materials. In particular, image quality is often reduced by the influence of drift, vibrations, or other instabilities during acquisition. Drift corrected frame integration (DCFI) is an acquisition method within the Thermo Scientific Velox Software that overcomes this problem, producing images with high contrast and a high signal-to-noise ratio. The addition of Integrated Differential Phase Contrast (iDPC) Software enables the collection of easily interpretable high-resolution images with more reliable, simultaneous imaging of light and heavy elements, even at low-dose conditions.
High-resolution transmission electron microscopes from Thermo Fisher Scientific
The Spectra S/TEM instruments take high-resolution imaging one step further with additional aberration correction via the S-CORR probe aberration corrector, making sub-Angstrom (<0.8 Å) S/TEM imaging regularly attainable. Finally, new Talos and Spectra S/TEM instruments feature the Panther STEM detection system, which includes optimized mechanical alignment and detector geometry for better multi-signal acquisition and mechanical alignment accuracy. It has a higher throughput and easier operation, with linear response of gain/offset and more flexibility in signal processing. Visualize more details with up to 16 segments and a new amplifier design with ultrahigh electron sensitivity for low-dose STEM.
With the combination of high-quality automated S/TEM instrumentation and leading software solutions, HRTEM and HRSTEM imaging are more accessible than ever, giving you the ability to gather unparalleled atomic-resolution information on your most challenging materials.
Gallium nitride [212] imaged with HAADF (DCFI) STEM at 300 kV, showing 40.5 pm Ga-Ga dumbbell splitting and 39 pm resolution in the fast Fourier transform on a wide gap (S-TWIN) pole piece.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Grundlagenforschung in der Materialforschung
Neuartige Materialien werden in immer kleineren Dimensionen untersucht, um ihre physikalischen und chemischen Eigenschaften bestmöglich zu kontrollieren. Die Elektronenmikroskopie gibt Forschern wichtige Einblicke in eine Vielzahl von Materialeigenschaften auf der Mikro- bis Nanoebene.
Batterieforschung
Die Entwicklung von Batterien wird durch die Multiskalen-Analyse mit Mikro-CT, REM und TEM, Raman-Spektroskopie, XPS und digitaler 3D-Visualisierung und 3D-Analyse ermöglicht. Erfahren Sie, wie dieser Ansatz die strukturellen und chemischen Informationen liefert, die für den Bau besserer Batterien benötigt werden.
Nanopartikel
Materialien haben im Nanobereich grundsätzlich andere Eigenschaften als im Makrobereich. Um diese zu untersuchen, können S/TEM-Geräte mit energiedispersiver Röntgenspektroskopie kombiniert und so Daten mit einer Auflösung im Nanometerbereich und sogar darunter erfasst werden.
Metallforschung
Die effektive Produktion von Metallen erfordert eine präzise Kontrolle von Einschlüssen und Ausscheidungen. Unsere automatisierten Geräte können eine Vielzahl von Aufgaben ausführen, die für die Metallanalyse wichtig sind, einschließlich der Zählung von Nanopartikeln, der chemischen Analyse mittels EDS und der Vorbereitung von TEM-Proben.
Fasern und Filter
Durchmesser, Morphologie und Dichte synthetischer Fasern sind wichtige Parameter, die die Lebensdauer und Funktionalität eines Filters bestimmen. Die Rasterelektronenmikroskopie (REM) ist die ideale Technologie für die schnelle und einfache Untersuchung dieser Merkmale.
Polymerforschung
Die Mikrostruktur von Polymeren bestimmt die Eigenschaften und die Leistungsfähigkeit des Materials. Die Elektronenmikroskopie ermöglicht eine umfassende Analyse der Morphologie und Zusammensetzung von Polymeren im Mikroskalenbereich für Anwendungen in der F+E und Qualitätskontrolle.
Geologische Forschung
Die Geowissenschaften beruhen auf einer konsistenten und präzisen, mehrskaligen Beobachtung von Merkmalen in Gesteinsproben. Die REM-EDS ermöglicht in Kombination mit Automatisierungssoftware eine direkte, umfangreiche Analyse der Textur und Mineralzusammensetzung für die petrologische und mineralogische Forschung.
Katalyseforschung
Katalysatoren sind für einen Großteil der modernen industriellen Prozesse von entscheidender Bedeutung. Ihre Effizienz hängt von der mikroskopischen Zusammensetzung und Morphologie der katalytischen Partikel ab; EM mit EDS eignet sich ideal für die Untersuchung dieser Eigenschaften.
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