Search
Materials Science
3D Electron Microscopy
3D electron microscopy through focused ion beam milling and scanning electron microscopy imaging.
Join the conversation
48ab - Aplicaciones/Muestras/Productos/Recursos/Póngase en contacto con nosotros
3D electron microscopy
Whether studying new materials or attempting to find the root causes of failures, highly localized characterization of increasingly complex samples with ever-smaller features is becoming increasingly critical. In fact, sub-surface or three-dimensional characterization is often required to fully understand the material properties of a sample. This can be particularly useful for heterogeneous materials or the detection and characterization of inclusions and precipitates. DualBeam (focused ion beam – scanning electron microscopy, FIB-SEM) instrumentation enables the acquisition of high-quality 3D datasets, at nanometer resolution, by serial sectioning (sequential application of SEM imaging and FIB milling).
Plasma FIB (PFIB)
Often, large volumes, which are inaccessible with conventional gallium FIB instruments, are necessary to obtain representative and statistically relevant results due to the additional contextual information a large sample provides. Plasma FIB instruments, such as the Thermo Scientific Helios 5 PFIB DualBeam and the Thermo Scientific Helios Hydra DualBeam, offer excellent high-current performance enabling fully automated, high-quality, large-volume 3D datasets in a variety of modalities. Additionally, the multiple ion source technology of the Helios Hydra DualBeam allows you to choose the best ion source for each particular sample and use case.
Plasma FIB serial sectioning can provide information on materials contrast (with backscattered electron imaging), compositional information (with energy dispersive spectroscopy), and microstructural and crystallographic information (with electron backscatter diffraction). This data can then be visualized with Thermo Scientific Avizo Software, delivering a unique workflow solution for the highest-resolution, advanced 3D characterization and analysis at the nanometer scale.
Laser PFIB
The Thermo Scientific Helios 5 Laser PFIB System goes beyond regular plasma FIB to perform cross-sectioning and 3D characterization of even larger volumes, up to millimeter-scale (with >15,000x faster coarse material removal as compared to gallium FIB). It also facilitates the processing of materials that are typically challenging for ion beam milling, such as charging and beam sensitive materials, with minimal damage.
3D EBSD reconstruction of a zircalloy sample (250 x 250 x 220 μm³) produced with the Helios PFIB DualBeam, Auto Slice & View 4 Software, and Avizo Software.
Large volume femto-second laser tomography of a carbon-fiber reinforced composite acquired with Laser PFIB on the Helios DualBeam. Horizontal field width is 500 µm.
Large-area cross-section of a steel sample manufactured by selective laser melting technology. Total milling time by laser is <5 minutes (area: 600 x 350 µm). Femto-second laser processing results in high-quality cut face, which directly allows EBSD mapping without the need for post-cleaning with FIB.
Automotive paint scratch testing. High throughput, large-scale cross-sectional imaging was performed with the Helios Plasma FIB DualBeam.
3D reconstruction of W-Mo-Cu sample using a combination of BSE (green-blue) and EDS (orange) data, which has been produced with a Thermo Scientific Scios 2 DualBeam System, Auto Slice and View 4 and Avizo for Materials Science software.
Automotive oil filter casing (a polymer/glass fiber composite) imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Avizo Software. Horizontal field width is 350 µm.
Embedded tissue sample imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Amira Software, highlighting the ability of the Helios Hydra DualBeam to perform high-quality 3D characterization of organic materials.
Large volume femto-second laser tomography of a carbon-fiber reinforced composite acquired with Laser PFIB on the Helios DualBeam. Horizontal field width is 500 µm.
Large-area cross-section of a steel sample manufactured by selective laser melting technology. Total milling time by laser is <5 minutes (area: 600 x 350 µm). Femto-second laser processing results in high-quality cut face, which directly allows EBSD mapping without the need for post-cleaning with FIB.
Automotive paint scratch testing. High throughput, large-scale cross-sectional imaging was performed with the Helios Plasma FIB DualBeam.
3D reconstruction of W-Mo-Cu sample using a combination of BSE (green-blue) and EDS (orange) data, which has been produced with a Thermo Scientific Scios 2 DualBeam System, Auto Slice and View 4 and Avizo for Materials Science software.
Automotive oil filter casing (a polymer/glass fiber composite) imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Avizo Software. Horizontal field width is 350 µm.
Embedded tissue sample imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Amira Software, highlighting the ability of the Helios Hydra DualBeam to perform high-quality 3D characterization of organic materials.
Control de calidad y análisis de fallos
El control y garantía de calidad son esenciales en la industria moderna. Ofrecemos una gama de herramientas de EM y espectroscopía para el análisis multiescala y multimodal de defectos, lo que le permite tomar decisiones fiables e informadas para el control y la mejora de procesos.
Investigación sobre materiales fundamentales
Se investigan nuevos materiales a escalas cada vez más pequeñas para lograr el máximo control de sus propiedades físicas y químicas. La microscopía electrónica proporciona a los investigadores información clave sobre una amplia variedad de características materiales a escala nanométrica.
Investigación de baterías
El desarrollo de baterías se realiza mediante análisis multiescala con microCT, SEM y TEM, espectroscopía Raman, XPS y visualización y análisis 3D digital. Aprenda cómo este enfoque proporciona la información estructural y química necesaria para crear mejores baterías.
Investigación sobre polímeros
La microestructura polimérica determina las características y el rendimiento del material a granel. La microscopía electrónica permite un análisis exhaustivo en microescala de la morfología y composición de los polímeros para aplicaciones de control de calidad e I+D.
Investigación sobre metales
La producción eficaz de metales requiere un control preciso de las inclusiones y precipitados. Nuestras herramientas automatizadas pueden realizar varias tareas cruciales para el análisis de metales, incluyendo el recuento de nanopartículas, el análisis químico EDS y la preparación de muestras de TEM.
Gas y petróleo
A medida que la demanda de petróleo y gas continúa, existe la necesidad constante de una extracción eficiente y eficaz de hidrocarburos. Thermo Fisher Scientific ofrece una amplia gama de soluciones de microscopía y espectroscopía para una gran variedad de aplicaciones de la ciencia del petróleo.
Fibras y filtros
El diámetro, la morfología y la densidad de las fibras sintéticas son parámetros clave que determinan la vida útil y la funcionalidad de un filtro. La microscopía electrónica de barrido (SEM) es la técnica ideal para investigar rápida y fácilmente estas características.
Investigación geológica
Las ciencias geológicas están basadas en la observación uniforme y precisa de múltiples escalas de características dentro de las muestras de roca. SEM-EDS, combinado con software de automatización, permite el análisis directo a gran escala de la composición de la textura y los minerales para la investigación de la petrología y la mineralogía.
Style Sheet for Instrument Cards Original
Style Sheet for Komodo Tabs
Style Sheet to change H2 style to p with em-h2-header class
Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards
Electron microscopy services for
the materials science
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
