Electron Energy Loss Spectroscopy

48ab - 응용분야/시료/제품/리소스/문의하기

Over the last three decades, electron energy loss spectroscopy (EELS) has become a formidable characterization technique. Used in combination with a transmission electron microscope (TEM), it can provide atomic-level chemical and structural characterization. This includes information about elemental composition, chemical bonding, oxidation states, valence and conduction band electronic properties, and surface properties. It can also be used in conjunction with other techniques, such as electron tomography, to provide advanced 3D mapping of elements and oxidation states.

As materials characterization becomes increasingly more demanding, there is a growing need for highly localized characterization of increasingly complex structures with ever smaller features. Fortunately, improvements in EELS and S/TEM instrumentation have kept pace with these demands, with advances including spherical aberration correction of the S/TEM lenses, as well as the use of monochromators to improve energy resolution, providing sub-angstrom spatial resolution and a higher probe current.

EELS TEM

With our X-FEG/Mono, X-FEG/UltiMono and X-CFEG guns on the Thermo Scientific Spectra and X-FEG on the Thermo Scientific Talos S/TEM platforms, Thermo Fisher Scientific has all your EELS applications covered. These systems allow you to perform ultra-high resolution EELS analysis to obtain valuable structural, elemental, and chemical information at the atomic scale.

Resources

Images
Videos

BaTiO₃ and SrTiO₃ interface elemental map produced with atomic resolution EELS analysis.

Core-loss EELS atomic-resolution elemental map of a BaTiO₃/SrTiO₃ interface. Barium in blue, strontium in red and titanium in green. Imaged at 80 kV (60 pA) with a 1 eV full width at half maximum (FWHM) electron probe (49x49 pixels, <90 seconds).

Magnesium oxide crystal surface phonons characterized with EELS analysis.

Mapping of surface phonon modes in a magnesium oxide crystal at 60 kV using a monochromated electron probe with a full width at half maximum (FWHM) electron probe of <30 meV. Specimen and analysis courtesy of Isobel Bicket and Prof. Gianluigi Botton, The Canadian Centre for Electron Microscopy, McMaster University.

OptiMono+ exciting an X-FEG/UltiMono from the monochromator off state (with 1 eV energy resolution) to the monochromator fully excited state (<30 meV) at 60 kV.

Localized positions of plasmon excitations along a gold nanowire as a function of their excitation energy (between 0.18 – 1.2 eV), investigated with an electron probe of <0.2 eV energy resolution.

Images

Videos

OptiMono+ exciting an X-FEG/UltiMono from the monochromator off state (with 1 eV energy resolution) to the monochromator fully excited state (<30 meV) at 60 kV.

Localized positions of plasmon excitations along a gold nanowire as a function of their excitation energy (between 0.18 – 1.2 eV), investigated with an electron probe of <0.2 eV energy resolution.

Applications