Transmission and scanning transmission electron microscopes (S/TEM) are invaluable tools for the characterization of nanostructures, providing a range of different imaging modes, as well as access to information on elemental composition and electronic structure with high sensitivity. As materials research progressively begins to focus more and more on optimizing material function and behavior at the nanoscale, accurate information at this resolution becomes increasingly essential. High-resolution TEM (HRTEM) and STEM (HRSTEM) deliver the most detailed structural information possible in order to fundamentally characterize samples down to their atomic organization. This is invaluable to nanomaterials research as minor structural inconsistencies and variations can result in substantial changes to the properties of the material. For example, the crystal structure and atomic spacing of the atoms in platinum nanoparticles can have a drastic impact on their catalytic behavior in hydrogen fuel cells.

Thermo Fisher Scientific offers hardware and software innovations for HRTEM and HRSTEM analysis of a broad range of samples, including beam-sensitive materials. In particular, image quality is often reduced by the influence of drift, vibrations, or other instabilities during acquisition. Drift corrected frame integration (DCFI) is an acquisition method within the Thermo Scientific Velox Software that overcomes this problem, producing images with high contrast and a high signal-to-noise ratio. The addition of Integrated Differential Phase Contrast (iDPC) Software enables the collection of easily interpretable high-resolution images with more reliable, simultaneous imaging of light and heavy elements, even at low-dose conditions.

The Spectra S/TEM instruments take high-resolution imaging one step further with additional aberration correction via the S-CORR probe aberration corrector, making sub-Angstrom (<0.8 Å) S/TEM imaging regularly attainable. Finally, new Talos and Spectra S/TEM instruments feature the Panther STEM detection system, which includes optimized mechanical alignment and detector geometry for better multi-signal acquisition and mechanical alignment accuracy. It has a higher throughput and easier operation, with linear response of gain/offset and more flexibility in signal processing. Visualize more details with up to 16 segments and a new amplifier design with ultrahigh electron sensitivity for low-dose STEM.

With the combination of high-quality automated S/TEM instrumentation and leading software solutions, HRTEM and HRSTEM imaging are more accessible than ever, giving you the ability to gather unparalleled atomic-resolution information on your most challenging materials.

Gallium nitride imaged at atomic resolution.
Gallium nitride [212] imaged with HAADF (DCFI) STEM at 300 kV, showing 40.5 pm Ga-Ga dumbbell splitting and 39 pm resolution in the fast Fourier transform on a wide gap (S-TWIN) pole piece.

Applications

Fundamental Materials Research_R&amp;D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Battery Research

Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.

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Nanoparticles

Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.

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Metals Research

Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.

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Fibers and Filters

The diameter, morphology and density of synthetic fibers are key parameters that determine the lifetime and functionality of a filter. Scanning electron microscopy (SEM) is the ideal technique for quickly and easily investigating these features.

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Polymers Research

Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.

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Geological Research

Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

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Products

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Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Talos F200X TEM

  • High resolution/throughput in STEM imaging and chemical analysis
  • Add in situ sample holders for dynamic experiments
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos L120C TEM

  • Increased stability
  • 4k × 4K Ceta CMOS camera
  • TEM magnification range from 25–650 kX
  • Flexible EDS analysis reveals chemical information

Velox

  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control & set-up
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