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Multi scale microscopy workflow plot showing microCT, PFIB, and TEM
Plot of volume and resolution that can be analyzed by various instruments
in the multi-scale analysis workflow.

As materials continue to advance, it is becoming increasingly important to not only examine them at ever-higher resolutions but to obtain these observations within the relevant macroscopic context. This necessitates correlating different imaging modes to the same coordinates for truly contextual insight. Measurements must also be obtained quickly enough for practical application in real-world process control and failure analysis environments. Thermo Fisher Scientific offers a complete workflow for the observation of materials, combining correlated imaging at various scales with additional information such as chemical composition.

Multi-scale analysis begins with micro-scale observation with non-destructive spectroscopic techniques. X-ray microtomography (microCT) produces a complete, 3D rendering of the sample through serial X-ray scans. These scans, or 2D tomograms, are digitally combined to form the 3D structure. With Thermo Scientific Heliscan MicroCT, the series of circular scans is replaced by a single, continuous helical scan. This allows for faster scanning at a lower dose, increasing the accuracy and amount of information obtained. MicroCT observations can provide resolution as low as 400 nm, making it an ideal tool for non-destructive surveying of the sample prior to higher resolution characterization.

Once a region of interest is identified, DualBeam (focused ion beam and scanning electron microscopy, FIB-SEM) instrumentation is used for closer surface analysis and sample extraction. (Note that the focused ion beam can consist of a liquid metal ion source (gallium) or a plasma FIB.) The SEM enables nanoscale surface analysis while the FIB/PFIB is used for serial sectioning, or to extract a thin sample lamella for further observation with transmission electron microscopy (TEM). The addition of a femtosecond laser to the PFIB-SEM allows for even more rapid sample preparation, cross-sectioning or serial sectioning. Subsequent TEM analysis provides atomic-scale materials characterization for complete insight into a sample’s elemental and structural composition.

True multi-scale microscopy generates high quality and reliable imaging across all instruments while also accurately aligning them into a complete representation of the sample. With Thermo Scientific automation and data analysis software, the entire multi-scale workflow becomes a guided and routine procedure that can be readily integrated into your process or quality control environment.

Multi scale microscopy workflow plot showing software and hardware
The multi-scale analysis workflow offered by Thermo Fisher Scientific integrating software and hardware.
*Maps is not directly integrated with mCT, it can load processed CT data.
**AutoScript is not available yet on HeliScan and TEM microscopes.

Resources

HeliScan MicroCT analysis used in the correlative study of defects in an oil filter casing made of a glass-fiber-reinforced composite.

Characterizing material failure of an additively manufactured Inconel 718 part with multi-scale analysis. Performed in collaboration with the University of Manchester.

HeliScan MicroCT analysis used in the correlative study of defects in an oil filter casing made of a glass-fiber-reinforced composite.

Characterizing material failure of an additively manufactured Inconel 718 part with multi-scale analysis. Performed in collaboration with the University of Manchester.

Applications

Quality control and failure analysis using electron microscopy

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Recherche sur les batteries

Le développement de batteries est possible grâce à une analyse multi-échelle avec la microCT, la SEM et la TEM, la spectroscopie Raman, la XPS ainsi que la visualisation et l’analyse 3D numériques. Découvrez comment cette approche fournit les informations structurelles et chimiques nécessaires à l’amélioration des batteries.

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Recherche sur les polymères

La microstructure des polymères détermine les caractéristiques et les performances globales du matériau. La microscopie électronique permet une analyse complète à échelle microscopique de la morphologie et de la composition des polymères pour les applications de recherche et développement (R&D) et de contrôle de la qualité.

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Recherche sur les métaux

La production efficace de métaux nécessite un contrôle précis des inclusions et des précipités. Nos outils automatisés peuvent effectuer toute une série de tâches essentielles à l’analyse des métaux, notamment le comptage des nanoparticules, l’analyse chimique par EDS et la préparation des échantillons par TEM.

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Recherche dans le domaine de la catalyse

Les catalyseurs sont essentiels pour la majorité des processus industriels modernes. Leur efficacité dépend de la composition microscopique et de la morphologie des particules catalytiques ; l’EM avec l’EDS est parfaitement adaptée à l’étude de ces propriétés.

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Pétrole et gaz

Comme la demande de pétrole et de gaz ne cesse de croître, il existe un besoin continu de procéder à une extraction efficace et rentable des hydrocarbures. Thermo Fisher Scientific propose une gamme de solutions de microscopie et de spectroscopie pour une variété d’applications de sciences pétrolières.

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Recherche géologique

La géoscience repose sur une observation uniforme et précise multi-échelle des caractéristiques des échantillons de roches. La SEM-EDS, associée à un logiciel d’automatisation, permet une analyse directe à grande échelle de la texture et de la composition minérale pour la recherche en métrologie et en minéralogie.

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Fibres et filtres

Le diamètre, la morphologie et la densité des fibres synthétiques sont des paramètres clés qui déterminent la durée de vie et la fonctionnalité d’un filtre. La microscopie électronique à balayage (SEM) est la technique idéale pour étudier rapidement et facilement ces caractéristiques.

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Tests de matériaux automobiles

Chaque composant d’un véhicule moderne est conçu pour assurer la sécurité, l’efficacité et les performances. La caractérisation détaillée des matériaux automobiles à l’aide de la spectroscopie et de la microscopie électronique éclaire les décisions critiques concernant les processus, les améliorations des produits et les nouveaux matériaux.

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Products

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Apreo ChemiSEM System

  • Integrated SEM imaging and chemical characterization
  • Enhanced automation to simplify workflows
  • Extended source lifetime and schedulable upgrades

AutoScript TEM

  • Provides a direct link between research needs and microscope automation
  • Enables improved reproducibility and accuracy
  • Focuses time on the microscope for higher throughput

FIB-SEM and Laser Ablation

  • All three beams have same coincident point for accurate and repeatable cut placement
  • Millimeter-scale cross sections with up to 15,000x faster material removal than a typical FIB
  • Statistically relevant deep subsurface and 3D data analysis

Thermo Scientific Helios Hydra plasma focused ion beam scanning electron microscope (DualBeam)

Helios Hydra DualBeam

  • 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials
  • Ga-free TEM sample preparation
  • Extreme high resolution SEM imaging

Helios 5 PFIB DualBeam

  • Gallium-free STEM and TEM sample preparation
  • Multi-modal subsurface and 3D information
  • Next-generation 2.5 μA xenon plasma FIB column
Thermo Scientific Scios 2 plasma focused ion beam scanning electron microscope (DualBeam)

Scios 3 FIB-SEM

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities

Spectra Ultra

  • New imaging and spectroscopy capabilities on the most beam sensitive materials
  • A leap forward in EDX detection with Ultra-X
  • Column designed to maintain sample integrity.

Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Talos F200S TEM

  • Intuitive and easy-to-use automation software
  • Available with Super-X EDS for rapid quantitative chemical analysis
  • High-throughput with simultaneous multi-signal acquisition

Talos F200i TEM

  • Compact design with X-TWIN objective lens
  • Available with S-FEG, X-FEG, and X-CFEG
  • Flexible and fast EDS options for comprehensive elemental analysis
Thermo Scientific Talos F200C transmission electron microscope (TEM)

Talos F200C TEM

  • High-contrast and high-quality TEM and STEM imaging
  • 4k x 4k Ceta CMOS camera options for large FOV and high read-out speeds
  • Large pole piece gap and multiple in situ options

Talos F200X TEM

  • High-resolution, EDS cleanliness, and quality in 2D as well as 3D
  • X-FEG and X-CFEG available for the highest brightness and energy resolution
  • High accuracy and repeatable results with integrated Thermo Scientific Velox Software

AutoTEM 5

  • Fully automated in situ S/TEM sample preparation
  • Support of top-down, planar and inverted geometry
  • Highly configurable workflow
  • Easy to use, intuitive user interface
Thermo Scientific Auto Slice and View 4.0 serial section electron microscopy software

Auto Slice and View 4.0 Software

  • Automated serial sectioning for DualBeam
  • Multi-modal data acquisition (SEM, EDS, EBSD)
  • On-the-fly editing capabilities
  • Edge based cut placement

Avizo Software
Materials Science

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms
Thermo Scientific Maps electron microscopy software

Maps Software

  • Acquire high-resolution images over large areas
  • Easily find regions of interest
  • Automate image acquisition process
  • Correlate data from different sources
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Electron microscopy services for
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To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.