Thermo Scientific HeliScan MicroCT brings a new era of micro computed tomography to materials science by leveraging advanced helical scanning and iterative reconstruction technology to produce excellent image fidelity. As part of a multi-scale imaging solution, HeliScan MicroCT enables you to gain valuable insight from internal structures to explore and validate a wide range of material properties.

Key Features

Accurate segmentation

HeliScan MicroCT is the only microCT system specifically designed for quantification of high-quality, geometrically precise images.

Fast-throughput, high-quality analysis

Helical scanning and a large cone angle, combined with proprietary autofocus and drift correction, deliver high signal-to-noise ratio. Efficient scans of representative volumes provide ready-to-segment raw data that reduces the need for digital manipulation.

Better statistical relevance

Seamless representative volumes of high-aspect-ratio samples captured in one scan rather than inefficient, artifact-prone multi-scan with stitching.

Customizable, dynamic in situ experiments

Customizable feed-through ports, adaptable stages and a cabinet designed as a versatile, open platform easily support your experiments.

Ease of use and reliability

The system is optimized for multi-user environments, with advanced features available for expert users. Instrument components are chosen for dependability and serviceability.


Specifications

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X-ray source

    20 - 160 kV, power = 8 W

X-ray detector

    3072 × 3072 pixels, 16 bit, flat pane

Spatial resolution

    800 nm

Sample diameter

    Up to 240 mm

Load capacity

    15 kg

Sample stage

  • Y-range: 
    • Source – Stage: 400 mm
    • Source – Detector: 750 mm
  • Z-range: 195 mm
  • R-range: 360° continuous
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Aluminum silicon alloy silumin imaged with microCT.
Comparison of resolution for a conventional (800 nm) source versus the improved HeliScan X-ray source (400 mm) on an aluminum-silicon alloy (silumin) sample (800 nm voxel size).

Introduction to the Thermo Scientific HeliScan MicroCT.

Webinar: Advanced microCT for non-destructive material characterization

Register for this webinar and learn how researchers at the Center for Electron Microscopy and Analysis (CEMAS) at The University of Ohio use the HeliScan microCT as a valuable component of a multi-scale, multimodal workflow that progresses samples from x-ray imaging through higher-resolution imaging with a focused ion beam/scanning electron microscope to atomic-scale analysis in a transmission electron microscope.

Register to watch

Aluminum silicon alloy silumin imaged with microCT.
Comparison of resolution for a conventional (800 nm) source versus the improved HeliScan X-ray source (400 mm) on an aluminum-silicon alloy (silumin) sample (800 nm voxel size).

Introduction to the Thermo Scientific HeliScan MicroCT.

Webinar: Advanced microCT for non-destructive material characterization

Register for this webinar and learn how researchers at the Center for Electron Microscopy and Analysis (CEMAS) at The University of Ohio use the HeliScan microCT as a valuable component of a multi-scale, multimodal workflow that progresses samples from x-ray imaging through higher-resolution imaging with a focused ion beam/scanning electron microscope to atomic-scale analysis in a transmission electron microscope.

Register to watch

Applications

Quality Control_Thumb_274x180_144DPI

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

Contact us

Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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